Відображення:

АНАЛІЗ
 Властивості об’єктів:

2016 SJR

2016 SNIP

2016 CiteScore

Active or Inactive

All Science Classification Codes (ASJC)

Article language in source(three-letter ISO language codes)

Other related title 2

Other related title 3

Publisher's Country


 Пошук:

Electronic Device Failure Analysis


  • Print-ISSN 15370755
    • Active or Inactive Active
      • Article language in source(three-letter ISO language codes) ENG
        • Publisher's Name ASM International
          • Publisher imprints grouped to main Publisher ASM International
            • Publisher's Country United States
              • All Science Classification Codes (ASJC) Electrical and Electronic Engineering
                • All Science Classification Codes (ASJC) Safety, Risk, Reliability and Quality
                  • 2016 CiteScore 0.04
                    • 2016 SJR 0.101
                      • 2016 SNIP 0.128